index - PCM Accéder directement au contenu

Derniers dépôts

Rechercher

Nombre de documents

77

Nombre de notices

277

Mots-clés

Calcined clay CHLORINE PLASMAS A Thin films Capacitance B2 Quaternary Alloying Functionalization Physical vapor deposition Selenization B2 Semiconducting alloys Aryl-diazonium salts SF 6 C Photoelectron spectroscopy Non-volatile memory Residual stress Carbon nitride AZO thin films Thin film A1 Characterization Applications industrielles CIGSe Kirkendall effect Biomasse Carbon Scanning electron microscopy Chalcogenide Films 3 nm in size Mott insulator B1 Inorganic compounds Chalcogenides Avalanche breakdown Low-pressure plasma processing Optical properties Semiconductors Resistive switching Nanocomposite Etching AlN Alzheimer's disease Ablation laser A Multilayers Band alignment B3 Solar cells Titanium dioxide A Chalcogenides TiO2 Amorphous Bixbyite Plasmas froids B2 Semiconducting indium compounds Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation Aluminium nitride A3 Physical vapor deposition processes Colloidal solution Bipolar resistive switching BRS Structure PECVD X-ray diffraction Chemical detection Plasma etching Carbon Nanotube Buffer Couple Biofilms microbiens Sputtering Transmission electron microscopy X-ray photoelectron spectroscopy Atomic force microscopy Adsorption Spectroscopic ellipsometry Band gap Thin films NEXAFS CH4 Chemical and biological sensors Copper V2O3 Amyloid precursor B Chemical synthesis TEM Anatase Transfert d'énergie CNTs’ collapse Mott insulators Oxides Carbon nanotubes XPS AuCu alloy Vanadium Sesquioxide Cathepsin Biocapteurs A-CNx Ambipolar material Atomic layer etching BOMBARDMENT Chalcogenide glass Sol-gel Nanotubes CaTiO3Pr^3^+ Magnetron sputtering